Abstract: Langmuir probe technique was used for the plasma diagnostics of double-glow plasma surface alloying process.Effects of the process parameters on plasma parameters were discussed.
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美
- 摘 要: 用朗缪尔单探针技术对离子渗金属中的等离子体参数进行了诊断, 讨论工艺参数对等离子体参数的影响。