Apparatus used for analysis and detection included X-ray diffraction system (XRD), scanning electron microscopy (SEM) with energy dispersive X-ray spectrometer (EDS), and electron probe microanalyzer (EPMA).

• 采用的分析测试仪器包括X-射线衍射仪、扫描电镜及其附带的能谱仪和电子探针显微分析仪。