Based on the analysis of excessive power dissipation of full-scan BIST, we present partial scan algorithm which selects a portion of registers for scan cells to implement low power BIST.

• 摘要在分析全扫描内建自测试(BIST)过高测试功耗原因的基础上，提出了一种选择部分寄存器成为扫描单元的部分扫描算法来实现低功耗BIST。