Characterization on the morphology, particle size and spectrum properties have been done with TEM, UV-vis absorption spectrometer, and Photoluminescence spectra. 2.

• 利用紫外-可见（UV-vis）吸收光谱、荧光发射(PL)光谱、透射电子显微镜(TEM)等表征手段对得到的荧光半导体量子点进行形貌、大小、结晶性、光谱特性和成份等进行分析。