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- Discharge conditions at which depth profile analysis of tinplate had good depth resolution were selected by researching spectrometric behaviors of tinplate at different discharge conditions. 摘要通过研究不同放电条件下镀锡钢板的光谱行为,确定了具有较好深度分辨率的放电条件,建立了镀锡钢板的辉光放电发射光谱定量深度分析方法。
- By using sputtering rate correction, linear calibration curve of mutil matrixes was established and the quantitative depth profile analysis of the coating of the colored steel strips was reached. 通过溅射率校正,建立了多基体的线性校准曲线,解决了彩涂钢板涂镀层的逐层定量分析。
- A Si/Mo noncrystalline multilayer film sample was cut into two equal pieces in surface area for two times SIMS depth profile analysis by using RAS POINT MODE and POINT MODE respectively. 本文主要介绍了辉光放电光谱仪的分析原理、分析特点以及在钢铁分析中的两个主要应用 :基板分析和深度剖面分析。
- Depth Profiling Analysis 深度剖面分析
- AUGER DEPTH PROFILE ANALYSIS OF Ge_xSi_(1-x)/Si SUPERLATTICE Ge_xSi_(1-x)/Si超晶格的俄歇深度剖面分析
- Study on depth profile analysis of the coating of colored steel strips by glow discharge optical emission spectrometry 彩涂钢板涂镀层的辉光放电发射光谱逐层分析方法研究
- Quantitative depth profile analysis of tinplate with glow discharge optical emission spectrometry 镀锡钢板辉光放电发射光谱法定量深度分析研究
- Secondary ion mass spectroscopic depth profile analysis of oxygen contamination in hydrogenated microcrystalline silicon 二次离子质谱深度剖面分析氢化微晶硅薄膜中的氧污染
- A focused transducer is employed for photoacoustic depth profiling of port wine stain(PWS) skin. 本文提出了一种基于聚焦换能器的光声深度分辨技术来实现对PWS皮肤的评估。
- Previously, profiling Analysis Services showed the time in Coordinated Universal Time (UTC). 以前,探查Analysis Services时显示的是通用协调时间(UTC)。
- depth profile analysis 逐层分析
- Therefore this proteomic expression profiling analysis could be applied to the identification and quality control of medicines. 因此,蛋白质组表达模式分析可以应用于药物的鉴定与质量控制。
- 4.Discharge conditions at which depth profile analysis of tinplate had good depth resolution were selected by researching spectrometric behaviors of tinplate at different discharge conditions. 摘要通过研究不同放电条件下镀锡钢板的光谱行为,确定了具有较好深度分辨率的放电条件,建立了镀锡钢板的辉光放电发射光谱定量深度分析方法。
- For an accurate depth profiling of the Ge concentration, detailed knowledge of the dependence of the refractive index of the SiGe alloy as a function of the Ge concentration is required. 对于一个准确的锗浓度纵向分布来说,需要有锗硅合金的反射率关系以作为锗浓度的函数的详细知识。
- The X ray Photoelectron Spectroscopy (XPS) has been used for the element qualitation,quantitation,chemical state analysis and depth profile of InGaAsP/InP MOCVD film. 采用X射线光电子能谱(XPS)对InGaAsP/InP异质结构MOCVD外延晶片作了表面薄层元素、组分定性、定量和深度分布分析。
- Microhardness, depth profile and wear mechanisms were investigated by means of MVK H12, TALYSURF6, XPS and microscopy. 采用显微硬度、轮廓深度、XPS、显微镜观察等研究磨损机理。
- Surface chemical analysis - Depth profiling - Measurement of sputtered depth 表面化学分析。深度剖面。溅涂深度的测量
- APPLICATION OF FACTOR ANALYSIS TO AUGER DEPTH PROFILING OF Ta_2O_5/Ta 因子分析法在Ta_2O_5/Ta俄歇深度剖析上的应用
- A non-destructive remote technique for obtaining depth profile of laser processed metals by laser- induced IR photothermal radiometry is reported. 介绍了一种用激光诱发红外光热辐射法对金属材料激光表面硬化层进行深度剖析的新技术。
- Wav profile document analysis, including each kind of common processing, uses in the profile analysis aspect. wav波形文件的分析,其中包括各种常见的处理,用于波形分析方面。