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- This paper introduces the verification method of ASL3000 IC test system. 摘要介绍了ASL3000集成电路测试系统的检定方法。
- Analysing the capability of IC test in ATES, Points out requiring to solve theproblems based on Bill Transmitter Order(BTO), and then discusses the operation tactics ofIC test. 分析了ATES测试的生产能力,指出了测试生产中的不足之处,最后阐述了IC测试运作策略。
- Now we focus on IC test handler, it's production included most of the assembly types, for example DIP,SOP,SSOP,TSSOP,QFP,TO series,QFN etc. 目前主要生产集成电路分选机,产品品种涵盖目前市场上的绝大多数封装品种,如DIP,SOP,SSOP,TSSOP,QFP,TO系列等。
- At last, an effective solution to the synchronization of digital and analog mixed signal IC test system is found so that the test system works accurately, stably and reliably. 提出了解决数模混合信号集成电路测试系统同步问题的有效方案,使数模混合信号集成电路测试系统准确、稳定和可靠。
- With development of the semiconductors industry and appearance of new ASIC, SOC devices the paper analyzes new requirement and challenge proposed by IC test, and described new solution of the ATE and new system feature also. 本文从半导体产业的飞速发展 ,新型集成电路ASIC、SOC等器件的出现 ,分析了对IC测试提出的新要求和挑战。 阐述了ATE(自动测试设备 )产业可采取的新的解决方案及新型测试系统的性能与特点。
- CMOS device dimensions scale down to the very deep submicrometer.ICs are going towards higher density, higher speed and lower power dissipation making new challenges on IC test and design for test. 摘要CMOS器件进入超深亚微米阶段,集成电路(IC)继续向高集成度、高速度、低功耗发展,使得IC在测试和可测试性设计上都面临新的挑战。
- Agape Package Manufacturing (Shanghai) Ltd. is an IC testing and assembly house jointly funded by USA, Japan, Taiwan and Hong Kong-based investors. 葵和精密电子(上海)有限公司是一家由美国,日本,台湾及香港的投资者联合出资成立的IC封测企业。
- A Discussion on IEEE Standards Concerning IC Test 集成电路测试相关标准研究与探讨
- Study on Silicon-gate CMOS IC Test Pattern 硅栅CMOS集成电路测试图形的研究
- This article introduced the basic conception of combined digital IC, including classification of digital IC test, controllability, observation, testability, fault, limitation and invalidation etc. 摘要介绍了数字集成电路测试的基本概念,包括测试的分类,以及可控性、可观性、可测性、故障、失效和缺陷等概念;
- A simple test will show if this is real gold. 简单的试验就能证明这是否是真金。
- New Architecture of Accurate Clock Generator in IC Test System IC测试系统精密定时器的新结构
- ATS of D/A Mixed Signal IC Test System Based on VXI Bus VXI数模混合信号集成电路测试系统
- Pupils who pass the test will be promoted to the next higher grade. 小学生只要考试及格就会升到高年级。
- He held the test tube in his hand thoughtfully. 他沉思地把试管拿在手里。
- It will be wise to go over your test paper again. 还是把您的考卷再检查一遍的好。
- Let us show you to see the engine to test. 让我们指给你看要测试的发动机。
- He is answering the test paper busily. 他正忙着答考试卷。
- Don't tumble down on this easy test. 这次考试不难,你可别考砸了。
- Tomorrow we'll have a history test. 明天我们将进行历史测验。