In the research of light quantity to the crystal material and in the survey to the crystal retards component, the measuring accuracy is influenced heavily because of the photo source fluctuation.
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美
- 摘要在对晶体材料的光学性质的研究和对晶体器件延迟量的测量中,常因光源起伏影响测量精度,出现较大的测量误差。