Influence of V2O5 on properties of the TiO2 nano-composite film was studied with X-ray diffraction (XRD), atomic force microscopy (AFM) and ultraviolet visible and near-infia-red spectroscopy (UV-VIS-NIR).
英
美
- 使用XRD、AEM、UV-VIS-NIR分光光度计等方法研究了V2O5对TiO2纳米复合薄膜性能的影响。