Microstructure of SiC/Al composite has been examined with SEM (scanning electron microscope), EDX (energy dispersive X|ray analyzer) and XRD (X|ray diffractometer).
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- 采用扫描电镜(SEM);能谱仪器(EDX)和X射线衍射仪(XRD)研究了SiCp/Al复合表面层结构.