Properties of TiO2 thin film were studied by XRD, UV-spectra, measuring the contact angle, measuring the thickness and Methylene Blue degradation experiment.

• 采用XRD、UV透射光谱、薄膜表面接触角的测量、厚度的测量及亚甲基蓝降解等手段研究了TiO2薄膜的性能.