Scanning electric microscope (SEM) analysis was used to observe the morphology of the fabric during the pretreatment and Cu/Ni-P coating growing process.

  • 采用扫描电镜(SEM)分析了不同的粗化时间对织物表面粗糙度的影响和化镀铜和镍过程中的表面形态变化。
目录 查词历史