Small angle X-ray diffraction curve revealed that multilayer films arranged regularly layer-by-layer.Atomic force microscopy(AFM) was applied to determine the surface topograph and roughness.

• 小角X射线衍射结果显示多层膜呈现出层层规则排列,运用原子力显微镜对涂层的表面形貌以及粗糙度分析证明随着层数的增加表面形貌得到改善,由粗糙逐渐变得平滑。