So, if 20 areas have defects from dust or scratches on a single wafer generating 2,000 LSI chips, there would still be at least 1,980 usable chips in the batch.

• 如果一块可以生产2000枚大规模集成电路芯片的晶元上由于灰尘或者滑痕产生了20个瑕疵，那么它仍然可以生产出至少1980块可用的芯片。