The experimental results of I-V characteristics and the temperature dependence of critical currents show that the intrinsic Josephson junctions in Tl2Ba2CaCu2O8 thin films are of the SIS type.

• 对薄膜微桥I-V特性和临界电流随温度变化关系的测试表明，Tl2Ba2CaCu2O8薄膜中的本徵约瑟夫森效应呈现SIS结特性。