The microstructures and physics properties of the SBN films were characterized by XRD, AFM, SIMS, Raman scattering, and spectrophotometer, electrical induced birefringence etc.

• 用X射线衍射仪(XRD)、原子力显微镜(AFM)、二次离子质谱(SIMS)、受激拉曼散射、分光光度计、电致双折射(自建系统)等方法对SBN薄膜的结构性能和物理性能进行了表征。