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- easy test generation circuit [计] 容易产生测试的电路
- ETG ( Easy Test Generation ) Circuits 容易产生测试的电路
- Don't tumble down on this easy test. 这次考试不难,你可别考砸了。
- easy test generation [计] 容易产生测试
- I don't know how he failed in such an easy test. 我不明白这样简单的考试,他怎么会不及格。
- On the other hand, incrementing K also increases the probability of overlapping, hindering the test generation process. 就另一方面而言,增加K块区域且增加重叠的可能性,也阻挡了测试生成过程。
- Figure 4-7 depicts a general circuit for testing capacitor leakage. 图4-7是测试电容器漏电的一般电路。
- The simulation results show that it is available to use chaotic search for I(subscript DDT) test generation. 模拟实验结果表明,将这种方法用于瞬态电流测试产生是可行的。
- Through keyboard and code generation circuit, coding and pulse modulation vibration with infrared project to form infrared project circuit. 通过键盘及代码生成电路、编码、脉冲调制振荡和红外发射构成红外发射电路。
- The Bianconeri, who lead the table with 38 points, will visit Spezia on Saturday and Marchionni is aware that it will not be an easy test. 黑白军团目前以38分高居意乙榜首,将在周六造访斯佩齐亚,马尔基奥尼觉得这不是一次简单的考验。
- Dai Hongyu, Zhou Runde. A sinusoidal power clock generation circuit for energy recovery logic. Microe-lectronics, 34(2004)1, 71 8722;76, (in Chinese). 戴宏宇;周润德.;用于能量回收逻辑的正弦功率时钟电路
- By using backtrace and backtrack of FAN algorithm, the efficiency of test generation algorithm has be improved. 利用了FAN算法的多路回退和回溯等主要特色,提高了测试生成算法的效率。
- Revisable high voltage driving waveform generation circuit is designed, 2.Data storage and control circuit is designed. 3. 2、设计制作了可编辑的高压驱动波形产生电路,产生波形、时间参数、能量恢复时间参数等实时调节的高压驱动波形。
- Unit test generation does not automatically add the AspNetDevelopmentServer attribute or the TryUrlRedirection method call. 单元测试生成不会自动添加AspNetDevelopmentServer属性或TryUrlRedirection方法调用。
- Finally,using the novel architecture and algorithm,an example of power generation circuit applied in ultra high frequency(UHF) passive transponder integrated circuit(IC) is given. 然后基于提出的电路结构和算法;给出了特高频无源电子标签电源产生电路的设计实例.
- Low coverage indicates a process problem, which might require test generation technique to be improved, or training to be imparted to the tester. 低的覆盖率表明方法有问题,可能是测试生成技术需要改进,也可能需要给测试人员提供培训。
- Bai, Andre, et.al., 1998: Fast Antirandom (FAR) Test Generation to Improve Code Coverage. Software Research Institute. SanFrancisco, CA, USA. 何淼等,1995:板齿鼠种群中长期预测的时间序列模型。走向21世纪的中国生态学。中国生态学会。
- It is simple and eliminates the complicated timing issue during test generation for the crosstalk fault in the conventional approaches. 此方法简单且消除了传统方法在产生串音障碍测试图样时的复杂时间考量。
- A kind of simple and easy test method is, the daub on the skin of preexistence elbow inside a few face film, after 20 minutes if do not have allergic reaction, criterion but apply is on the face. 一种简易的测试方法是,先在手肘内侧的皮肤上涂抹少量面膜,20分钟后若无过敏反应,则可敷在脸上。
- Functional Test Generation for VLSI Circuit VLSI电路功能测试码的生成