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- THE MODEL SK-3 OCSILLATING QUARTZ CRYSTAL FILM THICKNESS MONITOR SK-3型石英晶体振荡膜厚监控仪
- The progress of optical thin film thickness monitoring 光学薄膜膜厚监控方法及其进展
- film thickness monitor 膜厚监测仪
- Nanospec Film Thickness Measurement System. 薄膜测厚仪,用于测量薄膜厚度。
- Dry film thickness measured on a smooth test panel. 干膜厚度应在平滑的样板上测量。
- The extent of EHD film thickness. EHD油膜的厚薄程度。
- Effect of Thickness Monitoring Error and Inhomogeneity of Witness Glass on Film Thickness Monitoring 膜厚监控误差及监控片不均匀对膜厚监控的影响
- One millionth of a meter. Used to express applied film thickness. 一个百万分之一米。用于表述涂层的厚度。
- The convergent infrared optical monitor and controller were designed to monitor and control the film thickness in multilayer growth in fabricating immediate and far infrared band-pass filters. 摘要针对平行光红外光学系统存在光斑大、能量损失大等不足，设计了主要用于中远红外带通滤光片膜厚监控的会聚光红外光学系统及其光控系统。
- Even slight contamination could affect film thickness to a considerable degree. 即使存在一点污染物就会对液膜厚度产生一定程度的影响。
- Glue film thickness adjusted automatically according to machine speed. 上浆厚薄可依车速自动调整。
- film thickness monitoring 膜厚控制
- In this paper, the character of CCD and the effect on wideband monitor ing of optical film thickness have been discussed.Some typical CCDs and thei r collecting data systems have been introduced. 讨论了CCD的主要特性及对宽带膜厚监控系统的影响，介绍了典型的CCD数据采集系统。
- The process is to be optimized for promoting the film thickness uniformity. 通过选择合适的工艺、控制条件可以改善薄膜的厚薄均匀性。
- For intermediate paint in epoxy floor coating series on sealer or putty to increase film thickness and smoothness. 作为环氧地坪涂料系列的中间漆，涂于封闭底漆或腻子之上，用来增加漆膜厚度和涂层的平整性。
- The influence of paint coating number, mass fraction of diluent on film thickness and glossiness was studied. 研究了涂料涂装道数、稀释剂的质量分数对涂膜厚度和光泽度的影响。
- The desirable antifouling effect can be obtained when the film thickness meets the requirements. 漆膜厚度符合规定的要求时,可得到有效的防污效果。
- This shows that the impact ionizationeffect increasewith the decreasing of silicon film thickness. 这说明,随着硅膜厚度的减小,器件内部的碰撞离化效应增加。
- By the aid of VC++,the influence of thickness monitoring error and witness glass inhomogeneity on the thickness monitoring of optical films is analyzed. 借助于VC++编程从理论上模拟分析了膜厚监控误差以及监控片不均匀性对光学膜厚监控的影响。
- The combined effect of film thickness and stress on BTO ferroelectric behavior was studied. 实验结果表明,BTO薄膜中的应力为张应力。
