特征提取在近红外激光检测半导体内微缺陷中的应用

特征提取在近红外激光检测半导体内微缺陷中的应用的英文翻译

基本释义

• Application of the Characteristic Extraction for the Detection of the Internal Micro Bulk Defects in Semiconducting Materials by Near Infrared Laser Scattering Light Distribution Analyze Technology