Silver(Ag) layers and zirconia(ZrO_2) films deposited on K9 glasses are measured by this instrument,then using the scalar scattering method,the root mean square(RMS) roughness of these films are calculated.

• 利用该仪器对K9基底上的银(Ag)膜和氧化锆(ZrO2)薄膜进行了测量,并根据标量散射理论得到了表面均方根(RMS)粗糙度。