This allows utilizing combined SFM/SNOM probes in the contact mode where simultaneously the topography, the friction force and the optical transmission image of the sample are recorded.

• 在接触模式中利用这种SFM/SNOM组合探针可将样品的形貌像、摩擦力和光学透射像等信息同时记录下来。对于综合研究样品表面的介观性质十分有利。