poly-SiGe thin films

• 锗硅薄膜

poly-SiGe thin films的用法和样例：

例句

1. To this end, we have performed in situ ellipsometry measurements while etching through homogeneous, comparatively thick SiGe films of a known Ge content.
   为此，我们实施了对于刻蚀均匀的比较厚的已知锗浓度的锗硅薄膜的同步椭偏测量。