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- 聚乙烯醇与钛酸酯偶联剂化学反应的X射线光电子能谱研究Study of Chemical Reaction Between Polyvinyl Alcohol and Titanate Coupling Aget by X-Ray Photoelectron Spectroscopy
- X射线光电子能谱X-ray photoelectron spectroscopy
- 变角X射线光电子能谱ADXPS
- X射线光电子能谱在材料研究中的应用Applications of X-ray Photoelectron Spectroscopy(XPS)in Materials Research
- 砷化镓半导体表面自然氧化层的X射线光电子能谱分析X-Ray Photoelectron Spectrocopic Analysis of Native Oxides Layer on Gallium Arsenide Semiconductor Surface
- X射线光电子光谱法（XPS）XPS
- 软X射线能谱Soft X-ray spectrum
- 在螺旋电子光谱法、X射线光电子光谱法和二次离子质谱法中的样品加工Specimen Handling in Auger Electron Spectroscopy, X-Ray Photoelectron Spectroscopy and Secondary Ion Mass Spectrometry
- X光电子能谱X-ray photoelectron spectroscopy
- INCA-X射线能谱仪INCA X-ray energy dispersive spectrometer
- X射线光电子谱测定中电荷控制和电荷参照技术标准指南Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
- 双金属离子对配合物的X光电子能谱XPS of Bimetallic, Ion Pair Complexes
- 连续谱X射线在ICT中的能谱硬化修正模型Hardening Correction Model of Energy Spectrum for Continuous Spectrum X-Ray ICT
- 利用俄歇电子谱仪(AES)和X射线光电子谱仪(XPS)分析了探针表面层的金属杂质组份分布及深度分布。Auger electroa spectrometer (AES) and X-ray photoelectron spectrometer (XPS) were used to analyse the component distribution and depth distribution of the metal impurities on the probe surface layer.
- 喷气式Z箍缩等离子体辐射软X射线能谱的研究Study of soft X-ray energy spectra from gas-puff Z-pinch plasma
- 利用光致发光谱、X射线光电子谱和俄歇电子谱等技术研究了(NH_4)_2S_x和P_2S_5/(NH_4)_2S_5化学钝化GaAs(100)表面.Using photoluminescence (PL), X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy, we have analysed GaAs (100) sarfaces passivated with (NH4)2Sx and P2S5/(NH4)2Sx.
- 扫描电镜及X射线能谱仪在首饰镀层检测中的应用APPLICATION OF SEM AND EDS IN INSPECTION OF PLATING ORNAMENTS
- X射线衍射、X射线光电子能谱对PtSi薄膜形成机理的研究Study on the formation mechanism of PtSi film by X-ray diffraction and X-ray photo spectrum
- 膜上沙尘粒子的电子显微镜照片和它的X射线能谱(沙尘1样品)Electron micrograph of a dust particle on nitron-barium chloride film and its X-ray spectrum (sample of case 1)
- GB/T17359-1998电子探针和扫描电镜X射线能谱定量分析方法通则General specification of X-ray EDS Quantitative analysis for EPMA and SEM
