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- back scattering electron image 背散射电子图像
- back scatter electron technology 背散射电子技术
- back scattered electron detector 反散射电子检测器
- Compton Back Scattering(CBS) imaging is a radiation imaging technique that forms the image of an object by measuring CBS emitted from the object while it is irradiated. 康普顿背散射CBS(Compton Back Scattering)成像技术是利用从被照物体中放射出来的康普顿背散射线对物体内部进行成像的放射线成像技术。
- back scattered electron 反向散射电子
- Tarn Electronic Image Equipment Co., Ltd. 特霓电子影像设备有限公司。
- The principle of Laser Doppler Velocity (LDV) and the method of back scattering are presented. 介绍了激光多普勒测量技术的原理和后散射型固体表面测量方式。
- Non-scanning 3-D range-gated imaging lidar can improve the detection capability,image quality and distance accuracy of the system by suppressing back scattering and removing fuzzy distance. 无扫描3-D距离选通成像激光雷达能有效抑制后向散射,消除距离模糊,提高系统的探测能力、成像质量和距离精确性。
- AD603, a variable-gain amplifier, is used in the pre-amplifier circuit for restraining the back scattering and amplifying the laser signal of target. 信号前端放大电路采用AD603可变增益放大器，用于抑制水体后向散射并放大激光回波信号；
- The Application of SEM Backscattered Electron Image in Forensic,Sciences Inspection[J]. 引用该论文 丛者唐;刘明辉;余静;徐明华.
- electron back scattering diffraction 电子背散射衍射
- electron back scattering diffraction ( EBSD ) 背散射电子衍射技术（EBSD）
- The proton elastic scattering analysis (PESA) and proton non-Rutherford back scattering (PNBS) were used for measuring of the H, C, N and O contents in aerosol samples. 利用多离子束分析方法对气溶胶样品中的轻元素含量进行分析。
- Back-scattering electron image proved that Ag particles disperse on the surface of flake graphite uniformly and the average particle diameter is about 500 nm. 反向散射电子图像证明,银颗粒均匀分散在鳞片石墨表面上,其平均粒径为500nm。
- The methodical procedure includes that preparing a good dry Bitter pattern on the films surface and then observing by second electron image(SEI)with high resolution. 该方法的步骤是在试样表面制作高质量的干粉纹图,然后用高倍率二次电子象进行观察。
- electron back scattering diffraction (EBSD) 电子背散射衍射
- By synchrotron X-ray diffraction (XRD) and Rutherford back scattering(RBS),the microstructure evolution of oxidized Ni/Au contact to p-GaN annealed at different temperature in air are investigated. 用卢瑟福背散射(RBS)和同步辐射X射线衍射(XRD)研究了p-GaN上的Ni/Au电极在空气下不同温度合金后的微结构的演化;并揭示这种接触结构的欧姆接触形成机制.
- This calibration is usually carried out by employing a double exposure technique in which the diffraction pattern and electron image of a crystal of molybdenum trioxide are successively exposed. 这个标准通常利用使得衍射模型和一个三氧化钼的结晶体的电子成像成功展现的双投照技术来执行。
- With older microscopes and with less expensive modern microscopes there are generally only two lenses below the objective, each of which inverts the diffraction pattern and the electron image. 电子光学映像比如显微图和最终屏幕所见衍射模型之间180度倒置的出现是否有联系，取决于显微镜柱中目标通过透镜产生的映像的倒置数量。
- Technology for Image Reconstruction of Compton Back Scatter 康普顿背散射图象重建技术
