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- GB/T17507-1998电子显微镜X射线能谱分析生物薄标样通用技术条件General specification of thin biological standards for X-Ray EDS microanalysis in electron microscope
- X射线能谱技术（XPS）XPS
- 软X射线能谱Soft X-ray spectrum
- INCA-X射线能谱仪INCA X-ray energy dispersive spectrometer
- 用 X射线光电子能谱 （XPS），俄歇电子光谱（AES）和X射线能谱分析（EDAX）等表面分析技术对摩 擦表面进行了分析，结果表明Si3N4陶瓷－金属摩擦副具有优异的摩擦学特性；The surface analysis techniques of electron spectroscopy for chemical analysis (ESCA), Auger electron spectroscopy (AES) and energy dispersion analysis with X-rays were used to analyze friction surfaces. Test results show that Si3N4 ceramic possesses excellent tribological behavior under the test conditions.
- 用扫描电镜和X射线能谱仪分析研究了半导体器件键合用金丝的断口。Fracture surfaces of gold wire used for bonding semiconductor devices are researched by Scanning Electron Microscope (SEM) and Energy Dispersive Analysis of X-ray (EDX) .
- X荧光能谱技术应用于珠宝首饰检测的原理和方法PRINCIPLES AND METHODS OF EDXRF APPLICATED TO IDENTIFICATION OF GEMS AND JEWELRY
- 喷气式Z箍缩等离子体辐射软X射线能谱的研究Study of soft X-ray energy spectra from gas-puff Z-pinch plasma
- Ｘ射线能谱仪X-ray energy spectrometer
- α射线能谱学α-ray spectrometry
- X射线光电子能谱X-ray photoelectron spectroscopy
- 软X射线能谱定量测量技术研究Quantitative Measurement of Soft-X-Ray Spectrum Using Transmission Grating Spectrometer
- 变角X射线光电子能谱ADXPS
- X射线光电子能谱技术在高分子材料摩擦化学研究中的应用Application of XPS Technology in Polymer Tribochemical Study
- 连续谱X射线在ICT中的能谱硬化修正模型Hardening Correction Model of Energy Spectrum for Continuous Spectrum X-Ray ICT
- X射线光电子能谱在材料研究中的应用Applications of X-ray Photoelectron Spectroscopy(XPS)in Materials Research
- X射线能谱X ray spectroscopy
- 砷化镓半导体表面自然氧化层的X射线光电子能谱分析X-Ray Photoelectron Spectrocopic Analysis of Native Oxides Layer on Gallium Arsenide Semiconductor Surface
- HL-1装置硬X射线能谱及长脉冲放电与硬X射线的发射关系ENERGY SPECTRUM OF HARD X-RAYS AND CORRELATJON BETWEEN LONG PULSE DISCHARGE AND HARD X-RAY EMISSION IN THE HL-1 TOKAMAK
- 采用X射线光电子能谱（XPS）对InGaAsP/InP异质结构MOCVD外延晶片作了表面薄层元素、组分定性、定量和深度分布分析。The X ray Photoelectron Spectroscopy (XPS) has been used for the element qualitation,quantitation,chemical state analysis and depth profile of InGaAsP/InP MOCVD film.
